System reliability for LED-based products



Authors / Yazarlar

J. Lynn Davis RTI Int., Research Triangle Park, NC, USA

Karmann Mills ; Mike Lamvik ; Robert Yaga ; Sarah D. Shepherd ; James Bittle ; Nick Baldasaro ; Eric Solano ; Georgiy Bobashev ; Cortina Johnson ; Amy Evans

Abstract/ Özet

Results from accelerated life tests (ALT) on mass-produced commercially available 6" downlights are reported along with results from commercial LEDs. The luminaires capture many of the design features found in modern luminaires. In general, a systems perspective is required to understand the reliability of these devices since LED failure is rare. In contrast, components such as drivers, lenses, and reflector are more likely to impact luminaire reliability than LEDs.

Published in/ Yayınlandığı Konferans

Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on


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